Cyber Resilience

CVE-2025-9709

High

Published: 05 September 2025

Published
05 September 2025
Modified
15 April 2026
KEV Added
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Patch
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CVSS Score v4 8.6 CVSS:4.0/AV:P/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:H/SI:H/SA:H/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:P/AU:X/R:X/V:X/RE:X/U:X
EPSS Score 0.0004 12.6th percentile
Risk Priority 17 60% EPSS · 20% KEV · 20% CVSS

Summary

CVE-2025-9709 is a high-severity On-Chip Debug and Test Interface With Improper Access Control (CWE-1191) vulnerability in Raelize (inferred from references). Its CVSS base score is 8.6 (High).

Operationally, ranked at the 12.6th percentile by exploit likelihood (below the median); it is not currently listed in the CISA KEV catalog.

EU & UK References

Vulnerability details

On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to…

more

the hardware system possible.

CWE(s)
CWE-1191CWE-1319

Related Threats

No named actor attribution yet. ATT&CK technique mapping in progress for this CVE.

Affected Assets

Raelize
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inferred from references and description; NVD did not file a CPE for this CVE

Mitigating Controls

Likely Mitigating Controls AI

Per-CVE control mapping for this CVE has not run yet; the list below is derived from the weakness types (CWEs) cited in the NVD entry.

SC-41 Port and I/O Device Access
addresses: CWE-1191

Directly mitigates exposure of on-chip debug and test interfaces by disabling or removing them.

SR-10 Inspection of Systems or Components
addresses: CWE-1191

Inspection of on-chip debug/test interfaces can identify tampering or unauthorized access that those interfaces enable.

References